Quasi-Fermi Level Splitting   system

• Wavelength range : 600~1100 nm

• In-situ PL : Real-time monitoring of crystallization and degradation.

• PL Mapping : Large-area scanning for film uniformity analysis.

• iVoc and Pseudo J–V :  ideal J-V curve that excludes the impact of series resistance(Rs).By utilizing optical data such as PLQY and QFLS, it predicts the theoretical efficiency limit of a device.